Research Laboratory
Equipment
Morphology of the material surface
Scanning electron microscope
(Leitz ISI 60)
for images up to > 100,000-fold magnification
Light microscopes
(Zeiss Ultraphot III + Leitz Orthoplan)
Normarski Interference Contrast (NIC): particle monitoring on surfaces (dark field) + fluorescence
Scanning electron microscope
AFM Atomic Force Microscope
Mechanical characteristics
Tear force analyser (Adamel DY 30)
Tear-/rip, elongation, material fatigue, chemical resistance
Roughness depth test device
(Mitutoyo Surf Test)
Surface roughness Ra, Ry, Rz
Thickness test device (Mitutoyo)
Thickness of papers and textile materials
Laboratory and microscale from 1.0 µg (Kern, Satorius)
Surface mass: gravimetric evaluation of absorption tests
Labuda Rotation Wiping Simulator (Clear & Clean)
Particle abrasion of textile materials (wet and dry)
Laser fluorescence measuring station (Systektum)
Rapid quantitative determination of thin oil layers
Roughness depth test device
Microscale
Particle abrasion
Particulate, particle release
Microscope-electronic image analysis measuring station (Leitz / Image Pro)
Labuda Part-Lift Collector for particle analysis on surfaces
Interferometric laser particle analyser (TSI)
Count of fluid-borne
particles > 0.19 µm
Laser particle counter (Climet / CAS)
Count of airborne
particles > 0.5 µm
Chemical analysis
Capillary Electrophoresis Analyzer (CE)
Ion concentration, real-time electropherograms, for anions and cations
Polarographic voltammetry (GAT)
Stripping voltammetry for heavy metal analysis in the ppt range
Conductivity meter (WTW)
Monitoring of the DI water quality
Tensiometer (Lauda)
Surface tension of liquids, surfactant release
FTIR Spectrometer (Agilent)
Analysis of chemicals in liquids, gases and solids
UV/VIS Spectrometer, Amersham
Monitoring of the DI water quality
Tensiometer
FTIR-Spectrometer
Electric field strength (EFS)
High Ohm Measuring Bridge (Thieming)
Surface Resistance of Paper and Textiles up to 1015 Ohm
Coulomb meter (Elab CM 04)
Measurement of electrical charges in the nC range
Digital field meter (JCI)
Measurement of triboelectric fields of papers and textiles up to 20 kV
Ehrler Drop slide measuring station
(Clear & Clean)
to produce material-specific triboelectric fields
Climate chamber (Rubarth)
Setting defined test climates between 20% and 95% relH
Ehrler Drop slide measuring station
Special measuring technology
Digital densitometer
(Clark / Grün)
Measurement of paper blacking by copying procedures
Linear wiping simulator
(Betex / Clear & Clean)
Measurement of the cleaning efficiency of textile and porous materials
Precision ellipsometer measuring unit
(DRE - Dr. Riß)
Layer thickness measurement in the picometre range, measurement of the cleaning efficiency in the molecular thickness range
Drop contour analysis / contact angle measurement
Detection of contaminant transfer to surfaces
Ellipsometer
Wiping simulator
Drop contour analysis
Clear & Clean GmbH
Phone +49-451-389500
Fax +49-451-3895020
info@clearclean.de
